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Boundary Scan Test System - List of Manufacturers, Suppliers, Companies and Products

Boundary Scan Test System Product List

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[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

[Case Study] Adoption of JTAG Testing for LTE Measurement Device Inspection

High-performance, high-quality measurement supported by JTAG boundary scan testing!

We would like to introduce a customer who has implemented "JTAG Boundary Scan Testing" for the inspection of LTE measurement devices. By adopting this product, it has become possible to reliably detect solder defects and pattern defects that cannot be identified through X-ray inspection using electrical testing. Additionally, systems that combine large-scale FPGAs and DDR memory were unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. However, by adopting this product, we were able to improve manufacturing quality. 【Case Study】 ■ Anritsu Corporation - Engaged in the field of information and communication, providing measurement solutions globally. ■ Challenges - Unable to identify defective areas during functional testing, making feedback to the manufacturing line difficult. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

[Case Study] Adoption of JTAG Testing for Inspection of Implementation Boards

Identify defective areas of BGA-mounted boards at the pin level to improve manufacturing quality!

We would like to introduce a customer who adopted "JTAG boundary scan testing" for failure analysis of BGA-mounted boards. After the introduction of our product, sufficient quality assurance can be achieved even for high-density printed circuit boards equipped with numerous BGA packages. 【Case Study】 ■ Saksa Tech Co., Ltd. Production Technology Department - Manufacturing focused on business phones and IC card reader-related products ■ Challenges - Unable to sufficiently establish test pins due to the large number of BGAs - Unable to adequately identify the cause of defects through functional testing - X-ray inspection cannot determine BGA open failures *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

[Case Study] Adoption of JTAG Testing for Tascam Products Inspection

JTAG boundary scan testing that improved reliability in the early stages of development!

We would like to introduce a case study of a customer who adopted "JTAG boundary scan testing" in the production line of their in-house developed products. For devices compatible with JTAG that are packaged in BGA format, the basic wiring checks are confirmed through JTAG testing before being handed over to the firmware team for boards that consist of DSP (CPU) + RAM + ROM. This approach eliminates wasted development time due to defects in board or component implementation, thereby improving development efficiency. [Case Study] ■ TEAC Corporation, Audio Equipment Division - Development and sales of audio equipment ■ JTAG testing is conducted from the prototype stage to enhance development efficiency. *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

[Case Study] Achieving Quality Assurance for BGA Assembly by Adopting JTAG Testing

Feedback the statistical data of BGA defects to manufacturing!

We would like to introduce a case study of a customer who identified defective areas on a BGA implementation board using "JTAG boundary scan testing." By utilizing this product, it became possible to pinpoint the locations of BGA implementation defects at the pin level. A cross-sectional analysis conducted with a microscope on the pins where defects occurred revealed that the cause of the implementation defects was due to the soldering areas being exposed to high temperatures for an extended period. Additionally, by reviewing the temperature management of the solder reflow process, we were able to improve the implementation quality of the board. [Case Study] ■ Oki Electric Communication Systems Co., Ltd. - Mechatronics and electronics design and production contract services ■ Quality assurance of BGA implementation using JTAG testing *For more details, please refer to the catalog or feel free to contact us.

  • Testing Equipment and Devices

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Supports boards with BGA! 【JTAG Test Application Case Collection】

Supports boards with BGA! 【JTAG Test Application Case Collection】

This is a collection of case studies on JTAG testing that led to improvements in quality and enhancements in testing scope.

JTAG boundary scan is a testing method that allows for easy implementation testing of boards with BGA components. It has various advantages, and I believe we can gain insights from the case studies. [Case Studies] - Azbil Corporation: Reduced untested areas with JTAG testing, providing peace of mind to customers! - Anritsu Corporation: JTAG testing supports high-performance and high-quality measurements! - Oki Electric Communication Systems: Achieved BGA implementation assurance through JTAG testing. - Konica Minolta Electronics: Established a consistent and advanced inspection system for high-density implementations. - Saksa Tech: Improved manufacturing quality by pinpointing defects on BGA boards at the pin level. - TEAC Corporation: Enhanced reliability in the early stages of development with JTAG testing. *The company names mentioned in the case studies are as they were at the time permission was granted for the introduction.*

  • Circuit Board Inspection Equipment

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